Can Combination of Low-Level Laser and Light-Emitting Diodes Enhance Stability of Dental Implants?
Use Low-Level Laser and Light-Emitting Diodes in Dental Implants
1 other identifier
interventional
28
0 countries
N/A
Brief Summary
Subjects were assigned in two groups: In group 1, subjects received LLL and LED 20 min/day for 10 days after implant insertion, subjects in group 2did not undergo LLL and LED. implant stability quotients(ISQs) were measured in 0,10,21,42 and 63 days after implant placement.
Trial Health
Trial Health Score
Automated assessment based on enrollment pace, timeline, and geographic reach
participants targeted
Target at below P25 for not_applicable
Started Jan 2014
Health score is calculated from publicly available data and should be used for screening purposes only.
Trial Relationships
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Study Timeline
Key milestones and dates
Study Start
First participant enrolled
January 1, 2014
CompletedPrimary Completion
Last participant's last visit for primary outcome
January 1, 2015
CompletedStudy Completion
Last participant's last visit for all outcomes
September 30, 2015
CompletedFirst Submitted
Initial submission to the registry
November 28, 2017
CompletedFirst Posted
Study publicly available on registry
December 5, 2017
CompletedDecember 5, 2017
December 1, 2017
1 year
November 28, 2017
December 3, 2017
Conditions
Keywords
Outcome Measures
Primary Outcomes (5)
Resonance frequency analysis
The stability of the implants was evaluated with resonance frequency analysis by the Osstell device
Immidate after implant placement (time 0)
Resonance frequency analysis
The stability of the implants was evaluated with resonance frequency analysis by the Osstell device
10 days (time1) after implant placement
Resonance frequency analysis
The stability of the implants was evaluated with resonance frequency analysis by the Osstell device
Three weeks after implant placement (time 2)
Resonance frequency analysis
The stability of the implants was evaluated with resonance frequency analysis by the Osstell device
Six weeks after implant placement (time 3)
Resonance frequency analysis
The stability of the implants was evaluated with resonance frequency analysis by the Osstell device
Nine weeks after implant placement(time 4)
Study Arms (2)
Laser Emitting group
ACTIVE COMPARATORsubjects received Low-Level Laser and Light-Emitting Diodes after implant placement
Non Emitting group
PLACEBO COMPARATORIn laser emitiiing group, subjects received Low-Level Laser and Light-Emitting Diodes after implant placement and in Non-emitting group,the same device was used while device was off.
Interventions
Combination of Low-Level Laser and Light-Emitting Diodes were used after dental implant placement for enhancement of stability
A dental implant with 4.8X 10 mm (Zimmer, USA) size was placed at the posterior of the mandible
Eligibility Criteria
You may not qualify if:
- Subjects were excluded from study enrollment if they had any diseases that affect bone, smoking, insufficient bone in the edentulous area which needs bone augmentation, failed to return for follow-up, or refused study enrollment.
Contact the study team to confirm eligibility.
Sponsors & Collaborators
Study Design
- Study Type
- interventional
- Phase
- not applicable
- Allocation
- RANDOMIZED
- Masking
- NONE
- Purpose
- OTHER
- Intervention Model
- PARALLEL
- Sponsor Type
- OTHER
- Responsible Party
- PRINCIPAL INVESTIGATOR
- PI Title
- associate Professor
Study Record Dates
First Submitted
November 28, 2017
First Posted
December 5, 2017
Study Start
January 1, 2014
Primary Completion
January 1, 2015
Study Completion
September 30, 2015
Last Updated
December 5, 2017
Record last verified: 2017-12